Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10788765 | Method and apparatus for measuring a structure on a substrate | Stefan Michiel Witte, Alessandro Antoncecchi, Hao Zhang, Paulus Clemens Maria PLANKEN, Kjeld Sijbrand Eduard Eikema +3 more | 2020-09-29 |