Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823759 | Test system and method of testing a wafer for integrated circuit devices | Lik Huay Lim, King Yon Lew, Mohsen H. Mardi, Xuejing Che | 2020-11-03 |
| 10783308 | Method of assigning contact elements associated with an integrated circuit device | Lik Huay Lim, King Yon Lew, Xuejing Che, Mohsen H. Mardi | 2020-09-22 |
| 10613137 | Probe head securing mechanism for probe assembly | Mohsen H. Mardi, Lik Huay Lim, King Yon Lew | 2020-04-07 |
| 10571517 | Probe head assembly | Mohsen H. Mardi, Lik Huay Lim, King Yon Lew | 2020-02-25 |