Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10276375 | Assistant pattern for measuring critical dimension of main pattern in semiconductor manufacturing | Hung-Wen Cho, Chaos Tsai, Feng-Jia Shiu | 2019-04-30 |
WL
Wen-Chen Lu
Overall (2019): #225,718 of 560,194Top 45%
1
Patents 2019