Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10276375 | Assistant pattern for measuring critical dimension of main pattern in semiconductor manufacturing | Hung-Wen Cho, Wen-Chen Lu, Feng-Jia Shiu | 2019-04-30 |
CT
Chaos Tsai
Overall (2019): #506,836 of 560,194Top 95%
1
Patents 2019