Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274517 | Conductive probe for inspection and semiconductor inspection device | Kohei Hironaka, Kazuya Souma, Ryosuke Yamaguchi | 2019-04-30 |
| 10235284 | Memory system | — | 2019-03-19 |
SS
Satoshi Shoji
Nhk Spring Co.: 1 patents #34 of 125Top 30%
Overall (2019): #123,629 of 560,194Top 25%
2
Patents 2019