Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274517 | Conductive probe for inspection and semiconductor inspection device | Kohei Hironaka, Kazuya Souma, Satoshi Shoji | 2019-04-30 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274517 | Conductive probe for inspection and semiconductor inspection device | Kohei Hironaka, Kazuya Souma, Satoshi Shoji | 2019-04-30 |