Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10411386 | Connection terminal | Toshio Kazama | 2019-09-10 |
| 10274517 | Conductive probe for inspection and semiconductor inspection device | Kohei Hironaka, Satoshi Shoji, Ryosuke Yamaguchi | 2019-04-30 |