Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10453703 | Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield | Young Jung Lee, Jae Woo Ryu, Byung Chun Kim, Soon Sung Park, Tae Hoon Kim +2 more | 2019-10-22 |
| 10361097 | Apparatus for stressing semiconductor substrates | Vladimir V. Voronkov, John A. Pitney, Peter Albrecht | 2019-07-23 |