Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10453703 | Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield | Young Jung Lee, Jae Woo Ryu, Robert J. Falster, Soon Sung Park, Tae Hoon Kim +2 more | 2019-10-22 |