Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10267636 | Method to test the quality factor of a MEMS gyroscope at chip probe | Sudheer S. Sridharamurthy, Zheng-Yao Sun, Wenhua Zhang, Te-Hsi Lee, Sanjay Bhandari +1 more | 2019-04-23 |