Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10395362 | Contour based defect detection | Ajay Gupta, Mohan Mahadevan, Sankar Venkataraman, Hedong Yang, Laurent Karsenti +2 more | 2019-08-27 |
| 10387996 | System and method for panoramic image processing | Shimon Cohen, Noga Zieber, Rotem Littman | 2019-08-20 |