Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10451412 | Apparatus and methods for detecting overlay errors using scatterometry | Michael Adel, Walter D. Mieher, Ady Levy, Michael Friedmann | 2019-10-22 |
| 10190867 | Real time dual mode full-field optical coherence microscopy with full range imaging | Avner Safrani | 2019-01-29 |