Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474128 | Abnormality analysis system and analysis apparatus | Toshiyuki Tsuzuki, Katsushi Kitamura, Sakon MURAYAMA, Yuki Ishigure | 2019-11-12 |
| 10286514 | Spindle condition detection device for machine tool | Koji Hasegawa, Takashi Matsui, Nobumitsu Hori, Osamu Higashimoto | 2019-05-14 |