Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474128 | Abnormality analysis system and analysis apparatus | Toshiyuki Tsuzuki, Katsushi Kitamura, Koji Kito, Yuki Ishigure | 2019-11-12 |
| 10354522 | Optical detection device and facility management system | Tomoyuki Nakagawa | 2019-07-16 |