Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10490296 | Memory built-in self-test (MBIST) test time reduction | Deepak I. Hanagandi, Aravindan J. Busi, Kiran K. Narayan, Michael A. Ziegerhofer | 2019-11-26 |
| 10423570 | Method and system for enumerating digital circuits in a system-on-a-chip (SOC) | Thomas Chadwick, Nancy H. Pratt | 2019-09-24 |
| 10394752 | Method and system for enumerating digital circuits in a system-on-a-chip (SOC) | Thomas Chadwick, Nancy H. Pratt | 2019-08-27 |