Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10490296 | Memory built-in self-test (MBIST) test time reduction | Michael R. Ouellette, Deepak I. Hanagandi, Aravindan J. Busi, Kiran K. Narayan | 2019-11-26 |
| 10438678 | Zero test time memory using background built-in self-test | Igor Arsovski, Eric D. Hunt-Schroeder | 2019-10-08 |