Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10490296 | Memory built-in self-test (MBIST) test time reduction | Michael R. Ouellette, Deepak I. Hanagandi, Kiran K. Narayan, Michael A. Ziegerhofer | 2019-11-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10490296 | Memory built-in self-test (MBIST) test time reduction | Michael R. Ouellette, Deepak I. Hanagandi, Kiran K. Narayan, Michael A. Ziegerhofer | 2019-11-26 |