Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Daisuke Hibino +1 more | 2019-10-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Daisuke Hibino +1 more | 2019-10-15 |