Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Yutaka Hojo, Daisuke Hibino +1 more | 2019-10-15 |
| 10190875 | Pattern measurement condition setting device and pattern measuring device | Shinichi Shinoda, Yasutaka Toyoda, Hiroyuki Ushiba | 2019-01-29 |