Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2019-10-15 |
| 10317203 | Dimension measuring apparatus and computer readable medium | Tsuyoshi Minakawa | 2019-06-11 |
| 10190875 | Pattern measurement condition setting device and pattern measuring device | Shinichi Shinoda, Hiroyuki Ushiba, Hitoshi Sugahara | 2019-01-29 |
| 10180317 | Pattern-measuring device and computer program | Hiroyuki Sindo | 2019-01-15 |