Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10423741 | Constrained metric verification analysis of a system on chip | Yosinori Watanabe, Yael Kinderman, Shlomi Uziel, Ido Avraham | 2019-09-24 |
| 10409939 | Statistical sensitivity analyzer | Yosinori Watanabe | 2019-09-10 |