PN

Patricius Jacobus Neefs

AB Asml Netherlands B.V.: 1 patents #281 of 721Top 40%
📍 Raamsdonksveer, NL: #1 of 2 inventorsTop 50%
Overall (2019): #318,242 of 560,194Top 60%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10508896 Measurement substrate and a measurement method Stoyan Nihtianov, Ruud Hendrikus Martinus Johannes Bloks, Johannes Paul Marie De La Rosette, Thibault Simon Mathieu Laurent, Kofi Afolabi Anthony Makinwa +1 more 2019-12-17