Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10508896 | Measurement substrate and a measurement method | Stoyan Nihtianov, Ruud Hendrikus Martinus Johannes Bloks, Thibault Simon Mathieu Laurent, Kofi Afolabi Anthony Makinwa, Patricius Jacobus Neefs +1 more | 2019-12-17 |
| 10268128 | Lithographic apparatus | Franciscus Johannes Joseph Janssen, Edwin Cornelis Kadijk, Nicolas Lallemant, Jan Liefooghe, Markus Matthes +4 more | 2019-04-23 |