Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10503144 | Anomaly detection with correlation coeffiecients | Heng HAO, James Tom Pye | 2019-12-10 |
| 10504006 | Classification, search and retrieval of semiconductor processing metrology images using deep learning/convolutional neural networks | Shreekant Gayaka | 2019-12-10 |
| 10460921 | High lateral to vertical ratio etch process for device manufacturing | Kyeong-Tae Lee, Sang-wook Kim, Daehee Weon, Sang-jun Choi, Jahyong Kuh | 2019-10-29 |
| 10387755 | Classification, search and retrieval of semiconductor processing metrology images using deep learning/convolutional neural networks | Shreekant Gayaka | 2019-08-20 |