Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145889 | Testkey structure and method of measuring device defect or connection defect by using the same | Wen-Jung Liao, Wen-Shan Hsiao | 2018-12-04 |
| 9978666 | Method for fabrication semiconductor device with through-substrate via | Ming-Tse Lin | 2018-05-22 |