Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145889 | Testkey structure and method of measuring device defect or connection defect by using the same | Kuei-Sheng Wu, Wen-Shan Hsiao | 2018-12-04 |
| 9964587 | Semiconductor structure and testing method using the same | Chien-Kuo Wang, Chun-Liang Hou | 2018-05-08 |