Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161965 | Method of test probe alignment control | Jui-Long Chen, Chien-Chih Liao, Chin-Hsiang Lin, Hui-Yun Chao, Jong-I Mou +1 more | 2018-12-25 |
| 9995770 | Multidirectional semiconductor arrangement testing | Huan Chi Tseng, Kuo-Chuan Chang, Yuan-Yao Chang, Chien-Chang Lee | 2018-06-12 |