Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161965 | Method of test probe alignment control | Chien-Chih Liao, Chin-Hsiang Lin, Hui-Yun Chao, Jong-I Mou, Tseng Chin Lo +1 more | 2018-12-25 |
| 10083860 | Semiconductor structure with resist protective oxide on isolation structure and method of manufacturing the same | Chen-Liang Liao, Chia-Yao Liang, Sheng Lin, Yi-Lii Huang, Kuo-Hsi Lee +1 more | 2018-09-25 |