Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163733 | Method of extracting defects | Jia-Rui Hu, Shu-Chuan Chuang, Chih-Ming Ke | 2018-12-25 |
| 10031997 | Forecasting wafer defects using frequency domain analysis | Yang-Hung Chang, Chih-Ming Ke, Chun-Ming Hu | 2018-07-24 |