Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10037397 | Memory cell including vertical transistors and horizontal nanowire bit lines | Victor Moroz | 2018-07-31 |
| 9953990 | One-time programmable memory using rupturing of gate insulation | Andrew E. Horch, Victor Moroz | 2018-04-24 |
| 9857409 | Negative bias thermal instability stress testing of transistors | Tzong-Kwang Henry Yeh, Shih-Yao Christine Sun, Raymond Leung | 2018-01-02 |