Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9857409 | Negative bias thermal instability stress testing of transistors | Jamil Kawa, Shih-Yao Christine Sun, Raymond Leung | 2018-01-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9857409 | Negative bias thermal instability stress testing of transistors | Jamil Kawa, Shih-Yao Christine Sun, Raymond Leung | 2018-01-02 |