Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161881 | System and method for inspecting a wafer | Ajharali Amanullah, Lin Jing, Han Cheng Ge | 2018-12-25 |
| 10151580 | Methods of inspecting a 3D object using 2D image processing | Albert Archwamety, Han Cheng Ge, Ruini Cao | 2018-12-11 |