Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161881 | System and method for inspecting a wafer | Lin Jing, Han Cheng Ge, Kok Weng Wong | 2018-12-25 |
| 9934565 | Systems and methods for automatically verifying correct die removal from film frames | Tim Hing Lai, Jing Lin, Lian Seng Ng, Soon Guan Tan | 2018-04-03 |
| 9863889 | System and method for inspecting a wafer | Han Cheng Ge | 2018-01-09 |