Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161881 | System and method for inspecting a wafer | Ajharali Amanullah, Han Cheng Ge, Kok Weng Wong | 2018-12-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161881 | System and method for inspecting a wafer | Ajharali Amanullah, Han Cheng Ge, Kok Weng Wong | 2018-12-25 |