Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157259 | Method and device for predicting reliability failure rate of semiconductor integrated circuit and method of manufacturing the semiconductor integrated circuit | Jeong Min JO, Yoo Hwan Kim, Hye-Won Shim | 2018-12-18 |
| 10014267 | Semiconductor device and method of manufacturing the same | Yong Sang Cho, Hyun-Suk CHUN, Young-Seok Jung | 2018-07-03 |
| 9892977 | FinFET and method of forming fin of the FinFET | Hyun Chul Sagong, Jin Ju Kim, June Kyun Park | 2018-02-13 |