Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157259 | Method and device for predicting reliability failure rate of semiconductor integrated circuit and method of manufacturing the semiconductor integrated circuit | Yoo Hwan Kim, Hye-Won Shim, Sang-Woo Pae | 2018-12-18 |
| 9880183 | Method for controlling a test apparatus in response to external room conditions and reaction device storage conditions | Eun Jeong JANG, Sung Hwa Lee, Jung Tae Lee | 2018-01-30 |
| 9869631 | Analysis device and method of determining mounted state of cartridge of the analysis device | Tae-Soo Kim, Sung Hwa Lee, Hyun Soo Jang | 2018-01-16 |