Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157259 | Method and device for predicting reliability failure rate of semiconductor integrated circuit and method of manufacturing the semiconductor integrated circuit | Jeong Min JO, Yoo Hwan Kim, Sang-Woo Pae | 2018-12-18 |