| 10163490 |
P-type field-effect transistor (PFET)-based sense amplifiers for reading PFET pass-gate memory bit cells, and related memory systems and methods |
Hoan Huu Nguyen, Francois Ibrahim Atallah, David Joseph Winston Hansquine, Jihoon Jeong |
2018-12-25 |
| 10115481 |
Read-assist circuits for memory bit cells employing a P-type field-effect transistor (PFET) read port(s), and related memory systems and methods |
Francois Ibrahim Atallah, David Joseph Winston Hansquine, Jihoon Jeong, Hoan Huu Nguyen |
2018-10-30 |
| 10024916 |
Sequential circuit with error detection |
James W. Tschanz, Nam Sung Kim, Janice C. Lee, Christopher B. Wilkerson, Shih-Lien Linus Lu +2 more |
2018-07-17 |
| 10026456 |
Bitline positive boost write-assist circuits for memory bit cells employing a P-type Field-Effect transistor (PFET) write port(s), and related systems and methods |
Jihoon Jeong, Francois Ibrahim Atallah, David Joseph Winston Hansquine, Hoan Huu Nguyen |
2018-07-17 |
| 10009016 |
Dynamically adaptive voltage-frequency guardband control circuit |
Lam Ho, Navid Toosizadeh, Shih-Hsin Jason Hu, Mohammad Reza Kakoee, Saravana Krishnan Kannan |
2018-06-26 |
| 9984730 |
Negative supply rail positive boost write-assist circuits for memory bit cells employing a P-type field-effect transistor (PFET) write port(s), and related systems and methods |
Jihoon Jeong, Francois Ibrahim Atallah, David Joseph Winston Hansquine, Hoan Huu Nguyen |
2018-05-29 |
| 9947406 |
Dynamic tag compare circuits employing P-type field-effect transistor (PFET)-dominant evaluation circuits for reduced evaluation time, and related systems and methods |
Francois Ibrahim Atallah, David Joseph Winston Hansquine, Jihoon Jeong, Hoan Huu Nguyen |
2018-04-17 |
| 9940992 |
Leakage-aware activation control of a delayed keeper circuit for a dynamic read operation in a memory bit cell |
Francois Ibrahim Atallah, Hoan Huu Nguyen |
2018-04-10 |
| 9915968 |
Systems and methods for adaptive clock design |
Palkesh Jain, Virendra Bansal, Manoj Mehrotra |
2018-03-13 |