Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10068745 | Charged particle beam device and sample holder for charged particle beam device | Toshie Yaguchi, Yasuhira Nagakubo | 2018-09-04 |
| 10056227 | Focused ion beam apparatus | Tsuyoshi Oonishi | 2018-08-21 |
| 9947506 | Sample holder and focused ion beam apparatus | Tsuyoshi Oonishi | 2018-04-17 |
| 9885639 | Sample carrying device and vacuum apparatus | Masakatsu Hasuda | 2018-02-06 |