Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056227 | Focused ion beam apparatus | Toshiyuki Iwahori | 2018-08-21 |
| 9947506 | Sample holder and focused ion beam apparatus | Toshiyuki Iwahori | 2018-04-17 |
| 9934940 | Control device, charged particle beam apparatus, program and method for producing processed product | Satoshi Tomimatsu, Hiroki Kawada, Hideo Sakai | 2018-04-03 |