Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10083814 | Electron microscope and sample observation method | Isao Nagaoki, Toshiyuki Oyagi, Hiroaki Matsumoto, Kiyotaka Nakano, Takeshi Sato | 2018-09-25 |
| 10068745 | Charged particle beam device and sample holder for charged particle beam device | Toshie Yaguchi, Toshiyuki Iwahori | 2018-09-04 |