Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10083814 | Electron microscope and sample observation method | Isao Nagaoki, Hiroaki Matsumoto, Kiyotaka Nakano, Takeshi Sato, Yasuhira Nagakubo | 2018-09-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10083814 | Electron microscope and sample observation method | Isao Nagaoki, Hiroaki Matsumoto, Kiyotaka Nakano, Takeshi Sato, Yasuhira Nagakubo | 2018-09-25 |