Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10030971 | Measurement system and method for measuring in thin films | Alok Vaid, Sridhar Mahendrakar, Mainul Hossain, Taher Kagalwala | 2018-07-24 |
| 9915624 | Optical metrology for in-situ measurements | Igor Turovets, Dario Elyasi | 2018-03-13 |