Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10030971 | Measurement system and method for measuring in thin films | Cornel Bozdog, Alok Vaid, Sridhar Mahendrakar, Taher Kagalwala | 2018-07-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10030971 | Measurement system and method for measuring in thin films | Cornel Bozdog, Alok Vaid, Sridhar Mahendrakar, Taher Kagalwala | 2018-07-24 |