Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10048142 | Evaluation method for bulk silicon carbide single crystals and reference silicon carbide single crystal used in said method | Kiyoshi Kojima | 2018-08-14 |
| 10031089 | Method for evaluating internal stress of silicon carbide monocrystalline wafer and method for predicting warpage in silicone carbide monocrystalline wafer | Kiyoshi Kojima, Kota Shimomura, Yukio Nagahata | 2018-07-24 |
| 9915011 | Low resistivity single crystal silicon carbide wafer | Tatsuo Fujimoto, Noboru Ohtani, Masakazu Katsuno, Hirokatsu Yashiro | 2018-03-13 |