Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163201 | Hardness test apparatus and hardness testing method | Takeshi Sawa, Akira Takada, Takuho Maeda | 2018-12-25 |
| 10102631 | Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program | Hiroyuki Yoshida, Akira Takada, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu +3 more | 2018-10-16 |
| 10027885 | Image measuring apparatus | Gyokubu Cho, Akira Takada, Takuho Maeda | 2018-07-17 |