Issued Patents 2018
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163201 | Hardness test apparatus and hardness testing method | Takeshi Sawa, Takashi Hanamura, Takuho Maeda | 2018-12-25 |
| 10147621 | Adhesive tape separating tool, manufacturing apparatus of semiconductor chip, manufacturing apparatus of MEMS device manufacturing apparatus of liquid ejecting head, and separating method of adhesive tape | Kazuyuki Harayama | 2018-12-04 |
| 10102631 | Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program | Hiroyuki Yoshida, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu, Hidemitsu Asano +3 more | 2018-10-16 |
| 10024774 | Hardness test apparatus and hardness testing method | Fumihiko Koshimizu, Makoto Kaieda | 2018-07-17 |
| 10027885 | Image measuring apparatus | Gyokubu Cho, Takashi Hanamura, Takuho Maeda | 2018-07-17 |
| 10001432 | Hardness test apparatus and hardness testing method | Eiji Furuta, Makoto Kaieda | 2018-06-19 |