Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10102631 | Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program | Hiroyuki Yoshida, Akira Takada, Gyokubu Cho, Koichi Komatsu, Hidemitsu Asano +3 more | 2018-10-16 |
| 10024774 | Hardness test apparatus and hardness testing method | Fumihiko Koshimizu, Akira Takada | 2018-07-17 |
| 10001432 | Hardness test apparatus and hardness testing method | Eiji Furuta, Akira Takada | 2018-06-19 |