Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Akira Okada, Hajime Akiyama | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Akira Okada, Hajime Akiyama | 2018-06-12 |