Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Akira Okada, Norihiro Takesako | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Akira Okada, Norihiro Takesako | 2018-06-12 |
| 9880196 | Semiconductor device inspection apparatus and semiconductor device inspection method | Akira Okada | 2018-01-30 |